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16/01/2026
Overcoming Atomic-Level Defects in GAA Designs: Challenges and Opportunities for the Semiconductor Industry
As the semiconductor industry marches toward ever-smaller nodes and higher performance targets, Gate-All-Around (GAA) transistors have emerged as a promising architecture for pushing Moore’s Law
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09/01/2026
Case Study: Enhancing Chip Yield and Assembly Efficiency Through Advanced Surface Passivation
A global leader in radiation detection and safety faced critical efficiency and yield challenges during the assembly and testing phase of their neutron detector sensor
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02/01/2026
Interface-Defect Density Kills Chip Performance
Defects have been one of the biggest issues for the semiconductor industry since its day one causing yield loss, reliability issues, and performance bottlenecks. As logic and memory nodes shrink,
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19/12/2025
How atomic-level cleaning technologies help meet challenges in medical ICs
In medical integrated circuits (ICs), ensuring the highest quality and performance is critical. Medical ICs are used in a variety of sensitive applications, including diagnostic
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05/12/2025
Why Semiconductor R&D Teams Must Consider Atomic-Level Defects and Contamination in Chip Design
In the race to develop faster, smaller and more energy-efficient chips, design teams often focus intensely on architecture, functionality and scaling strategies. However, an often-underappreciated
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28/11/2025
Turning OSAT Challenges into Opportunities: How Sidewall Passivation Can Drive Yield and Market Advantage
Outsourced Semiconductor Assembly and Test (OSAT) providers operate in one of the most competitive segments of the semiconductor value chain. Margins are thin, customer expectations
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07/11/2025
AI at the Edge: Why Power Consumption Becomes Mission Critical
Edge devices — from smartphones to IoT sensors, wearables and remote embedded systems — are increasingly expected to run AI inference locally. The benefits are
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24/10/2025
How Atomic-Level Surface Defects and Contamination Drive Up Water Consumption in Semiconductor Fabrication
Atomic-level defects and contamination in semiconductor surfaces affect on the water consumption in semiconductor fabrication. Impurities have a significant impact on manufactured chip performance and
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17/10/2025
Atomic-Level Impurities in Semiconductor Interfaces: A Strategic Guide for Business Development Teams
In today’s advanced semiconductor manufacturing, reducing defect density defines the difference between average and world-class yield performance. SisuSemi’s atomic-level approach helps to eliminate microscopic impurities
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10/10/2025
Meeting the energy challenge: Smarter IoT, edge AI and mobile devices with SisuSemi
We are witnessing an unprecedented surge in connected devices. With nearly 20 billion IoT nodes already deployed—and close to 20 billion mobile devices in use—the
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