A global leader in radiation detection and safety faced critical efficiency and yield challenges during the assembly and testing phase of their neutron detector sensor chips. The indispensable wafer dicing process – whether utilizing saws or lasers – created atomic-scale defects and contamination, that introduced large variation and Signal-to-noise levels for their detector sensor chips. … Read more
Defects have been one of the biggest issues for the semiconductor industry since its day one causing yield loss, reliability issues, and performance bottlenecks. As logic and memory nodes shrink, there is a shift from particle-level defects to atomic-level defects where interface defects are at focus area. These interface imperfections form electrical traps, pinholes, and localized leakage paths in thin films. Why Interface Defect Reduction Matters for … Read more
In medical integrated circuits (ICs), ensuring the highest quality and performance is critical. Medical ICs are used in a variety of sensitive applications, including diagnostic devices, implants, medical imaging, and monitoring equipment. These ICs require extreme reliability, precision, long-term-stability and durability to ensure that medical devices function correctly and meet safety standards. Also, malfunctions in … Read more
In the race to develop faster, smaller and more energy-efficient chips, design teams often focus intensely on architecture, functionality and scaling strategies. However, an often-underappreciated factor — atomic-level defects and contamination — plays a critical role in determining whether a design will meet real-world performance, yield and cost targets. As semiconductor nodes push into the … Read more
Outsourced Semiconductor Assembly and Test (OSAT) providers operate in one of the most competitive segments of the semiconductor value chain. Margins are thin, customer expectations are rising and differentiation is hard to achieve in what often feels like a commoditized service market. OSATs face three major business pressures: For OSATs, these challenges are amplified because … Read more
Edge devices — from smartphones to IoT sensors, wearables and remote embedded systems — are increasingly expected to run AI inference locally. The benefits are many: reduced latency, lower bandwidth demands, improved privacy, resilience without continuous cloud access. But these benefits bring a severe constraint: power. Edge devices are often battery-powered or otherwise tightly constrained … Read more
Atomic-level defects and contamination in semiconductor surfaces affect on the water consumption in semiconductor fabrication. Impurities have a significant impact on manufactured chip performance and quality, manufacturing yield, overall manufacturing economics and sustainability. Reducing of defects and contamination will greatly reduce water consumption and thus boost fabrication efficiency, chip performance and operations sustainability. Water consumption … Read more
In today’s advanced semiconductor manufacturing, reducing defect density defines the difference between average and world-class yield performance. SisuSemi’s atomic-level approach helps to eliminate microscopic impurities that lead to costly defects. In the relentless pursuit of Moore’s Law and beyond, semiconductor business development teams face increasingly complex decisions about technology investments. While much attention focuses on … Read more
We are witnessing an unprecedented surge in connected devices. With nearly 20 billion IoT nodes already deployed—and close to 20 billion mobile devices in use—the digital landscape is becoming increasingly intelligent and decentralized. From Industry 4.0 to agriculture, logistics to healthcare, connected devices are reshaping how data is gathered, processed, and acted upon. A key … Read more
In the world of semiconductors, the pursuit of perfection is a never-ending journey. Even the tiniest of imperfections, at the atomic level, can have a significant impact on the performance and quality of opto components. This blog post will delve into the challenges introduced by atomic-level impurities in semiconductor interfaces, their effects on power consumption … Read more